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* “Best Zero Defects Team” Medal awarded by RCA
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“BEST ZERO DEFECTS TEAM”PLATE AWARDED BY RCA
 
Gratitude Medal given by Industrial Technology Research Institute.  
Joint Gratitude Medal by ERSO and ITRI  
Doctoral degree certficate from Stanford Univeristy.  
 Pan Wen-Yuan honored as an IEEE Fellow  
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“Best Zero Defects Team” Medal awarded by RCA ABOUT >>
Size: 25 x 19 x 2 cm
Source: Pan Wen-Yuan Foundation 
Description: Medal awarded by RCA. The inscription reads as follows, “ PRESENTED TO ADVANCED SOLID STATE TECHNIQUES IN RECOGNITION OF ITS EXCELLENCE AS THE BEST ZERO DEFECTS TEAM IN THE RCA-CSD NEW YORK SYSTEMS LABORATORY.” 
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